Journal article icon

Journal article

Influence of mechanical, thermal, and electrical perturbations on the dielectric behaviour of guest-encapsulated HKUST-1 crystals

Abstract:

Metal–organic frameworks (MOFs) are emerging low-k dielectric materials for application in next-generation microelectronics and telecommunication devices. MOF dielectrics can function as smart sensors with high sensitivity and chemical selectivity, by leveraging the ubiquitous dielectric response of MOFs and overcoming the limitations of DC conductivity and fluorescence approaches. Herein we study the effects of material synthesis, applied mechanical stress (37–520 MPa), varying temperature (...

Expand abstract
Publication status:
Published
Peer review status:
Peer reviewed

Actions


Access Document


Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
ORCID:
0000-0002-5770-408X
Publisher:
Royal Society of Chemistry
Journal:
Journal of Materials Chemistry C More from this journal
Volume:
8
Issue:
37
Pages:
12886-12892
Publication date:
2020-08-14
Acceptance date:
2020-08-12
DOI:
EISSN:
2050-7534
ISSN:
2050-7526
Language:
English
Keywords:
Pubs id:
1128379
Local pid:
pubs:1128379
Deposit date:
2020-08-26

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP