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Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)(x)NbSe2 and (PbSe)(x)NbSe2

Abstract:

The surface of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2 is studied by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in air and nitrogen, in the range of 0.5 to 10 μm2. The cleaved surface of (LaSe)xNbSe2 presents flat non-stepped surfaces which crack and react. Inner layers do not appear to crack. The dynamic process taking place in the superficial layers produces pieces which arrange in a self-similar way and eventually gives rise to discrete...

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Publication status:
Published

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Publisher:
Elsevier
Journal:
SURFACE SCIENCE
Volume:
441
Issue:
2-3
Pages:
384-390
Publication date:
1999-11-01
DOI:
ISSN:
0039-6028
Language:
English
Keywords:
Pubs id:
pubs:18375
UUID:
uuid:23326b97-afe4-4785-9114-e4961d13afe8
Local pid:
pubs:18375
Source identifiers:
18375
Deposit date:
2012-12-19

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