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The structural and magnetic characterization of molecular-beam-epitaxy-grown FeMn-NiFe exchange-biased bilayers

Abstract:
Structural and magnetic characterizations have been performed on NiFe-FeMn exchange-biased bilayers grown by molecular beam epitaxy. The growth of the films showed high-quality epitaxy with well-defined flat interface between the layers. Magnetic measurements confirmed that the films showed not only a comparable exchange anisotropy field (Hex) to that of sputtered films but also a lowered threshold thickness of 2 nm at which Hex vanishes for the FeMn.
Publication status:
Published

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Publisher copy:
10.1109/TMAG.2002.802856
Journal:
IEEE TRANSACTIONS ON MAGNETICS More from this journal
Volume:
38
Issue:
5
Pages:
2758-2760
Publication date:
2002-09-01
DOI:
ISSN:
0018-9464
Language:
English
Keywords:
Pubs id:
pubs:202685
UUID:
uuid:21856e72-64ab-460b-9ec7-587262c2fcfc
Local pid:
pubs:202685
Source identifiers:
202685
Deposit date:
2014-09-14

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