Data for Potassium ions in SiO2: electrets for silicon surface passivation

Files:: fig9.fig

(fig, 28.0KB)

fig2.fig

(fig, 46.1KB)

fig6a.fig

(fig, 59.1KB)

fig8b.fig

(fig, 48.7KB)

fig4a.fig

(fig, 47.0KB)

fig6b.fig

(fig, 27.8KB)

fig8a.fig

(fig, 28.6KB)

fig4b.fig

(fig, 59.9KB)

fig5b.fig

(fig, 22.7KB)

fig5a.fig

(fig, 26.4KB)

Department:

Materials

Role:

Creator

Department:

Materials

Role:

Creator

Grant:

EP/M022196/1

Funding agency for:

Project

Format:: Digital
Documentation:: Raw data for lifetime, surface potenial, and flat band voltages is embedded in Matlab figures.

Potassium ions in SiO2: electrets for silicon surface passivation
Description:: This manuscript reports an experimental and theoretical study of the transport of potassium ions in thin silicon dioxide films. While alkali contamination was largely researched in the context of MOSFET instability, recent reports indicate that potassium ions can be embedded into oxide films to produce dielectric materials with permanent electric charge, also known as electrets. These electrets are integral to a number of applications, including the passivation of silicon surfaces for optoele...
Expand description
Collapse description

License:: Terms and Conditions of Use for Oxford University Research Archive

If you are the owner of this record, you can report an update to it here: Report update to this record