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Journal article

Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University

Abstract:

Applications relevant to carbon based nano-materials have been explored using a newly installed JEOL-2200FS field emission gun (FEG) (scanning) transmission electron microscope (S)TEM which is integrated with two CEOS aberration correctors for both the TEM image-forming and the STEM probe-forming lenses. The performance and utility of this newly commission hardware has been reviewed with a particular focus on operation at an acceleration voltage of 80. kV, thus bringing the primary electron b...

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Publication status:
Published

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Journal:
MICRON
Volume:
43
Issue:
4
Pages:
545-550
Publication date:
2012-03-05
DOI:
ISSN:
0968-4328
URN:
uuid:1ecab71e-df66-4c78-a335-e78f7e0fd7d6
Source identifiers:
322903
Local pid:
pubs:322903

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