Back to Search

Journal article

Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis

Abstract:: The development of nanoscale magnetic materials for applications in information storage systems relies heavily on the ability to engineer the properties of the layered structures from which such materials are fabricated. These properties are strongly dependent on the nature of the interfaces between the individual nanoscale magnetic layers, so knowledge of the interface chemistry is crucial. In this paper, we discuss the application of three-dimensional atom probe analysis to the characterisa...
Expand abstract
Collapse abstract

Publication status:: Published

Actions

Email

Email this record

Send the bibliographic details of this record to your email address.

Your Email
Please enter the email address that the record information will be sent to.

-
Your message (optional)
Please add any additional information to be included within the email.
Cite

Cite this record

APA Style

Larson, D., Petford-Long, A., Ma, Y., & Cerezo, A. (2004). Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis. ACTA MATERIALIA, 52(10), 2847–2862.

MLA Style

Larson, D., et al. “Information Storage Materials: Nanoscale Characterisation by Three-Dimensional Atom Probe Analysis.” ACTA MATERIALIA, vol. 52, no. 10, 2004, pp. 2847–62.

Chicago Style

Larson, D, A Petford-Long, Y Ma, and A Cerezo. 2004. “Information Storage Materials: Nanoscale Characterisation by Three-Dimensional Atom Probe Analysis.” ACTA MATERIALIA 52 (10): 2847–62.
Tweet
Print

Access Document

Publisher copy:: 10.1016/j.actamat.2004.03.015

Authors

+ Larson, D More by this author

Role:

Author

+ Petford-Long, A More by this author

Role:

Author

+ Ma, Y More by this author

Role:

Author

+ Cerezo, A More by this author

Institution:

University of Oxford

Division:

MPLS

Department:

Materials

Role:

Author

Bibliographic Details

Journal:: ACTA MATERIALIA
Volume:: 52
Issue:: 10
Pages:: 2847-2862
Publication date:: 2004-06-07
DOI:: 10.1016/j.actamat.2004.03.015
ISSN:: 1359-6454

Item Description

Language:: English
Keywords:: magnetic thin films

layered structures

atom probe
Pubs id:: pubs:13181
UUID:: uuid:1c51bc01-4670-4ea7-bb47-af12eda202d6
Local pid:: pubs:13181
Source identifiers:: 13181
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 2004

Licence:: Terms and Conditions of Use for Oxford University Research Archive

Metrics

Views and Downloads

About views and downloads

If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP