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AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach

Abstract:

Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is conventionally performed with raw electron backscatter patterns. These patterns are software processed to locate the band centres (and sometimes edges) from which the crystallographic index of each band is determined. Once a consistent index for many bands is...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted Manuscript

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Publisher copy:
10.1107/S1600576718010373

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
ORCID:
0000-0001-5343-9365
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Oxford college:
St Cross College
Role:
Author
ORCID:
0000-0002-8801-4102
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Grant:
Shell-Imperial Advanced Interfaces UTC
Publisher:
International Union of Crystallography Publisher's website
Journal:
Journal of Applied Crystallography Journal website
Volume:
51
Issue:
6
Publication date:
2018-10-11
Acceptance date:
2018-07-18
DOI:
EISSN:
1600-5767
ISSN:
0021-8898
Pubs id:
pubs:899078
URN:
uri:18ee803c-4e95-40a7-9a1b-97981947098c
UUID:
uuid:18ee803c-4e95-40a7-9a1b-97981947098c
Local pid:
pubs:899078

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