Conference item
Measurement of off-axial aberration
- Abstract:
- High-resolution observation of a large field of view with a high quality detector is important for single particle analysis or in-situ experiments. Consequently, evaluation of aberrations that depend on position in the field of view, (off-axial aberrations) is required. We report the experimental measurement of off-axial aberrations including higher order components in several optical conditions together with the corresponding off-axial phase maps.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
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(Preview, Version of record, pdf, 758.9KB, Terms of use)
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- Publisher copy:
- 10.1088/1742-6596/902/1/012011
Authors
Bibliographic Details
- Publisher:
- Institute of Physics
- Host title:
- Electron Microscopy and Analysis Group Conference 2017 (EMAG2017)
- Journal:
- Electron Microscopy and Analysis Group Conference 2017 (EMAG2017) More from this journal
- Publication date:
- 2017-10-01
- Acceptance date:
- 2017-10-01
- DOI:
- EISSN:
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1742-6596
- ISSN:
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1742-6588
Item Description
- Pubs id:
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pubs:809851
- UUID:
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uuid:10124bf2-a52f-44ed-a77b-0d044d7fcca1
- Local pid:
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pubs:809851
- Source identifiers:
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809851
- Deposit date:
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2018-02-27
Terms of use
- Copyright holder:
- Sawada and Kirkland
- Copyright date:
- 2017
- Notes:
- Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Published under licence by IOP Publishing Ltd
- Licence:
- CC Attribution (CC BY)
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