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Electronic structure at realistic Si(100)-SiO2 interfaces

  • Giustino, F, Bongiorno, A, Pasquarello, A
  • 2004-11-05
2
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Conference

Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides

  • Giustino, F, Umari, P, Pasquarello, A
  • 2004-04-05
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