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Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy.

  • Sebastian, A, Shamsudhin, N, Rothuizen, H, et al.
  • 2012-09-05
2
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Casimir probe based upon metallized high Q SiN nanomembrane resonator.

  • Garcia-Sanchez, D, Fong, KY, Bhaskaran, H, et al.
  • 2013-01-05
3
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A high stability beam-scanning confocal optical microscope for low temperature operation.

  • Grazioso, F, Patton, BR, Smith, JM
  • 2010-09-05
4
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Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopy.

  • Bhaskaran, H, Sebastian, A, Pauza, A, et al.
  • 2009-08-05
5
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Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis.

  • Ludwig, W, Reischig, P, King, A, et al.
  • 2009-03-05
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