EXPLORE THE UNIVERSITY OF OXFORD'S WORLD-CLASS RESEARCH

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Accurate evaluation of aberration for probe-forming system and influence of aberration on high-resolution STEM image

  • Sawada, H, Hosokawa, F, Kirkland, A
  • 2017-10-01
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2
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Measurement of off-axial aberration

  • Sawada, H, Kirkland, A
  • 2017-10-01
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