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Journal article

Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel Detectors

Abstract:

The fabrication of 3D detectors which requires bulk micromachining of columnar electrodes has been realized with advancements in MEMS technology. Since the fabrication of the first 3D prototype in Stanford Nanofabrication Facility in 1997, a significant effort has been put forth to transfer the 3D detector technology to large scale manufacturing for future high luminosity collider experiments, in which the radiation hardness will be the primary concern, and other applications such as medical ...

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Publication status:
Published

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Publisher copy:
10.1109/TNS.2011.2117439

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Journal:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE More from this journal
Volume:
58
Issue:
3
Pages:
1315-1323
Publication date:
2011-06-01
DOI:
EISSN:
1558-1578
ISSN:
0018-9499
Language:
English
Keywords:
Pubs id:
pubs:411041
UUID:
uuid:12a9a37e-89ea-4362-b165-ff3ed2675574
Local pid:
pubs:411041
Source identifiers:
411041
Deposit date:
2014-02-16

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