Analysis of dislocation densities using high resolution electron backscatter diffraction

Vilalta-Clemente, A; Jiang, J; Britton, B; Collins, D; Wilkinson, A

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Analysis of dislocation densities using high resolution electron backscatter diffraction

Alternative title:: Microscopy and Microanalysis 2015 Proceedings

Publication status:: Published

Peer review status:: Peer reviewed

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APA Style

Vilalta-Clemente, A., Jiang, J., Britton, B., Collins, D., & Wilkinson, A. (2015). Analysis of dislocation densities using high resolution electron backscatter diffraction. 21(S3), 1891–1892.

MLA Style

Vilalta-Clemente, A, et al. “Analysis of Dislocation Densities Using High Resolution Electron Backscatter Diffraction.” vol. 21, no. S3, 2015, pp. 1891–92.

Chicago Style

Vilalta-Clemente, A, J Jiang, B Britton, D Collins, and A Wilkinson. 2015. “Analysis of Dislocation Densities Using High Resolution Electron Backscatter Diffraction.” 21 (S3): 1891–92.
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Files:: MM2015 Vilalta-Clemente et al Microscopy & Microanalysis v21 p...

(Preview, Accepted manuscript, pdf, 374.8KB, Terms of use)

Publisher copy:: 10.1017/S1431927615010235

Authors

+ Vilalta-Clemente, A More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Jiang, J More by this author

Role:: Author

+ Britton, B More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Collins, D More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Wilkinson, A More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Engineering and Physical Sciences Research Council More from this funder

Grant:: EP/K034332/1; EP/J016098/1; EP/I021043/2

Publisher:: Cambridge University Press
Host title:: Microscopy and Microanalysis
Volume:: 21
Issue:: S3
Pages:: 1891-1892
Publication date:: 2015-01-01
DOI:: 10.1017/S1431927615010235
EISSN:: 1435-8115
ISSN:: 1431-9276

Pubs id:: pubs:606772
UUID:: uuid:ff01529f-ffce-4110-8fad-988c76a6c817
Local pid:: pubs:606772
Source identifiers:: 606772
Deposit date:: 2016-02-27
ARK identifier:: ark:/29072/ora_ff01529fffce41108fad988c76a6c817

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Copyright holder:: Microscopy Society of America
Notes:: Copyright © 2015 Microscopy Society of America. This is the accepted manuscript version of the paper. The final version is available online from Cambridge University Press at: http://dx.doi.org/10.1017/S1431927615010235

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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Analysis of dislocation densities using high resolution electron backscatter diffraction

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Analysis of dislocation densities using high resolution electron backscatter diffraction

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